1. W.Y. Li, X.P. Zhang, H.B. Qin, Y.-W. Mai, Joule heating dominated fracture behavior change in micro-scale Cu/Sn-3.0Ag-0.5Cu/Cu(Ni) joints under electro-thermal coupled loads, Microelectronics Reliability, 2018, 82: 224-227.
2. W.Y. Li, S.S. Cao, X.P. Zhang, A novel and facile synthesis of nano SnO2 with various morphologies by electric current stressing, Rare Metal Materials and Engineering, 2018, 9: 2647-2651.
3. W.Y. Li, H. Jin, W. Yue, M.Y. Tan, X.P. Zhang, Creep behavior of micro-scale Cu/Sn-3.0Ag-0.5Cu/Cu joints under electro-thermo-mechanical coupled loads, Journal of Materials Science: Materials in Electronics, 2016, 27(12), 13022-13033.
4. 李望云, 秦红波, 周敏波, 张新平, 电-力耦合作用下Cu/Sn-3.0Ag-0.5Cu/Cu微焊点的拉伸力学性能和断裂行为, 机械工程学报, 2016, 52(10): 46-53.
5. W.Y. Li, X.P. Zhang, Low and cryogenic temperature mechanical performance and fracture behavior of micro-scale Cu/Sn-3.0Ag-0.5Cu/Cu joints with the decreasing dimension, 19th International Conference on Electronic Packaging Technology, Shanghai, China, 8-11 Aug, 2018, 324-328.
6. W.Y. Li, M.B. Zhou, X.P. Zhang, Abnormal creep behavior of micro-scale Cu/Sn-3.0Ag-0.5Cu/Cu joints with different joint thicknesses under electro-thermo-mechanical coupled loads, 18th International Conference on Electronic Packaging Technology, Harbin, China, 16-19 Aug, 2017, 1642-1648.
7. W.Y. Li, S.S. Cao, X.P. Zhang, Size effect on creep deformation and fracture behavior of micro-scale Cu/Sn-3.0Ag-0.5Cu/Cu solder joints, 17th International Conference on Electronic Packaging Technology, Wuhan, China, 16-19 Aug, 2016, 860-864.
8. W.Y. Li, S.S. Cao, X.P. Zhang, Creep deformation and fracture behavior of micro-scale Cu/Sn-3.0Ag-0.5Cu/Cu joints under electro-thermo-mechanical coupled loads, 17th International Conference on Electronic Packaging Technology, Wuhan, China, 16-19 Aug, 2016, 988-993.
9. W.Y. Li, M.B. Zhou, X.P. Zhang, Creep behavior of Cu/Sn-3.0Ag-0.5Cu/Cu solder joints under tensile stress coupled with DC current stressing, 16th International Conference on Electronic Packaging Technology, Changsha, China, 11-14 Aug, 2015, 187-192.
10. W.Y. Li, H.B. Qin, M.B. Zhou, X.P. Zhang, The influence of imposed electric current on the tensile fracture behavior of micro-scale Cu/Sn-3.0Ag-0.5Cu/Cu solder joints, 15th International Conference on Electronic Packaging Technology, Chengdu, China, 12-15 Aug, 2014, 1030-1034.
11. H.B. Qin, W.Y. Li, M.B. Zhou, X.P. Zhang, Low cycle fatigue performance of ball grid array structure Cu/Sn-3.0Ag-0.5Cu/Cu solder joints, Microelectronics Reliability, 2014, 54(12):2911-2921.
12. 秦红波, 李望云, 李勋平, 张新平, BGA结构无铅微焊点的低周疲劳行为研究, 机械工程学报, 2014, 50(20): 54-62.
13. J.Q. Huang, M.B. Zhou, W.Y. Li, X.P. Zhang, Size effect on the interfacial reactions and microstructural evolution of Cu/Sn3.0Ag0.5Cu-ball/Sn3.0Ag0.5Cu-paste/Cu joints in flip-chip on BGA packaging, 17th International Conference on Electronic Packaging Technology, Wuhan, China, 16-19 Aug, 2016, 1010-1014.
14. J.Q. Huang, M.B. Zhou, W.Y. Li, X.P. Zhang, Interfacial reactions and formation of inter metallic compound of Sn-ball/Sn-3.0Ag-0.5Cu-paste/Cu joints in flip-chip on BGA packaging, 16th International Conference on Electronic Packaging Technology, Changsha, China, 11-14 Aug, 2015, 307-311.
15. 秦红波, 宇文惠惠, 李望云, 张新平, TSV结构微凸点互连热疲劳寿命的研究, 2013中国力学大会(“先进电子封装技术中的力学问题”主题分会), 2013年8月19-21日, 西安, A31-0842.