主要论文
1.Xingpeng Liu, Jun Zhu*, Zhipeng Wu, Epitaxial deposition of BaTiO3 on TiO2 buffered GaAs(001) substrate, Thin Solid Films, 2017, 641: 38-42
2.Xingpeng Liu, Bin Peng*, Wanli Zhang, Jun Zhu, Xingzhao Liu, Meng Wei, Novel AlN/Pt/ZnO Electrode for High Temperature SAW Sensors, Materials, 2017, 10: 69
3.Xingpeng Liu, Bin Peng*, Wanli Zhang, Jun Zhu, Xingzhao Liu, Meng Wei, Improvement of High-Temperature Stability of Al2O3/Pt/ZnO/Al2O3 Film Electrode for SAW Devices by Using Al2O3 Barrier Layer, Materials, 2017, 10, 1377
4.Xingpeng Liu, Bin Peng*, Wanli Zhang, Jun Zhu, Effects of Al2O3 coating layer on the high temperature conductive stability of Pt/ZnO/Al2O3 film electrode, Journal of Inorganic Materials, 2019, 34 (6), 605-610
5.Tangyou Sun, Jie Tu, Le Cao, Tao Fu, Qi Li, Fabi Zhagn, Gongli Xiao, Yonghe Chen, Haiou Li, Xingpeng Liu*(通讯作者), Zhiqiang Yu, Yue Li and Wenning Zhao*, Sidewall Profile Dependent Nanostructured Ultrathin Solar Cells With Enhanced Light Trapping Capabilities, IEEE Photonics Journal, 2020, 12(1): 8400112
6.Haiou Li, Lei Guo, Xingpeng Liu *(通讯作者) , Tangyou Sun * , Qi Li, Fabi Zhang, Gongli Xiao, Tao Fu and Yonghe Chen, High Temperature Conductive Stability of Indium Tin Oxide Films, Frontiers in Materials, 2020, 7:113
7.李海鸥,刘晶晶,彭 斌,王博文,刘兴鹏*(通讯作者),郭 磊,基于ZnOAl2O3缓冲层制备耐高温SAW器件电极,压电与声光,2021, 43(3):365-369
8.Yue Li , Yunxia Zhou, Yanrong Deng, Shiwo Ta, Zhao Yang, Haiou Li , Tangyou Sun, Yonghe Chen, Fabi Zhang, Tao Fu, Peihua Wangyang, Jun Zhu, Lizhen Zeng and Xingpeng Liu*(通讯作者),Formation and Effect of Deposited Thin TiO2 Layer With Compressive Strain and Oxygen Vacancies on GaAs (001) Substrate, Frontiers in Materials, 2022, 9:846428
9.Haiou Li, Kairui Mou, Bin Peng, Yanrong Deng, Xingpeng Liu*(通讯作者), Shiwo Ta, Zhao Yang, Tangyou Sun, Fabi Zhang, Qi Li, Gongli Xiao, Tao Fu, and Yonghe Chen, High-Temperature Conductive Stability of ITO/Pt Bilayer-Film Electrode for Applications in High-Temperature SAW Devices, Journal of nanomaterials, 2022, 2599390
10.Yue Li, Tianyang Feng, Tangyou Sun, Yonghe Chen, Haiou Li, and Xingpeng Liu*(通讯作者), Ferroelectricity and reliability performance of HfZrO films by N-plasma treatment on TiN electrode, Journal of Materials Science: Materials in Electronics, 2022, 33:23341-23350